Impact of Single Trap Random Telegraph Noise on Heterojunction TFET SRAM Stability
نویسندگان
چکیده
منابع مشابه
Impact of Random Telegraph Noise on CMOS Logic Delay Uncertainty
Logic Delay Uncertainty Takashi Matsumoto Department of Communications and Computer Engineering Kyoto University, Kyoto, Japan Email: [email protected] Kazutoshi Kobayashi Department of Electronics Kyoto Institute of Technology, Kyoto, Japan Hidetoshi Onodera Department of Communications and Computer Engineering Kyoto University, Kyoto, Japan Abstract—Statistical nature of RTN-...
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ژورنال
عنوان ژورنال: IEEE Electron Device Letters
سال: 2014
ISSN: 0741-3106,1558-0563
DOI: 10.1109/led.2014.2300193